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Materials Characterization Fundamentals
Fundamentals of materials characterization techniques aimed at an audience who is trying to use these techniques to interpret the chemical literature for the first time.
- Publisher
- Franklin & Marchall College
- Source
- LibreTexts
- License
- CC BY-NC-SA
- Language
- EN
- Category
- Basic Sciences
Contents· 24 sections
- Diffraction Techniques
- Crystal structure basics
- Electron Diffraction
- Other diffraction techniques
- WAXS and SAXS
- X-ray diffraction (XRD) basics and application
- Electrochemistry
- Cyclic Voltammetry (CV)
- Impedance Spectroscopy
- Electron and Probe Microscopy
- Atomic Force Microscopy (AFM)
- Basic TEM
- Scanning electron microscopy (SEM)
- TEM: Bright field versus dark field
- Transmission electron microscopy (TEM): TEM versus STEM and HAADF
- Spectroscopy
- Energy-Dispersive X-ray Spectroscopy (EDS)
- Light absorption and photoluminescence (PL) spectroscopy
- Raman Spectroscopy
- Solid-state nuclear magnetic resonance spectroscopy (Solid-state NMR)
- X-ray Photoelectron Spectroscopy (XPS)
- Thermal Analysis
- Differential scanning calorimetry (DSC) (empty)
- Thermogravimetric analysis (TGA)