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Surface Science
Surface science is the study of physical and chemical phenomena that occur at the interface of two phases, including solid–liquid interfaces, solid–gas interfaces, solid–vacuum interfaces, and liquid–gas interfaces.
- Author
- Roger Nix
- Publisher
- Queen Mary, University of London
- Source
- LibreTexts
- License
- CC BY-NC-SA
- Language
- EN
- Category
- Basic Sciences
Contents· 46 sections
- 01: Structure of Solid Surfaces
- 1.01: Introduction
- 1.02: Miller Indices (hkl)
- 1.03: Surface Structures- fcc Metals
- 1.04: Surface Structures- hcp Metals
- 1.05: Surface Structures- bcc metals
- 1.06: Energetics of Surfaces
- 1.07: Relaxation and Reconstruction
- 1.08: Particulate Metals
- 1.09: Other Single Crystal Surfaces
- 02: Adsorption of Molecules on Surfaces
- 2.01: Introduction to Molecular Adsorption
- 2.02: How do Molecules Bond to Surfaces?
- 2.03: Kinetics of Adsorption
- 2.04: PE Curves and Energetics of Adsorption
- 2.05: Adsorbate Geometries and Structures
- 2.06: The Desorption Process
- 03: The Langmuir Isotherm
- 3.01: Introduction
- 3.02: Langmuir Isotherm - derivation from equilibrium considerations
- 3.03: Langmuir Isotherm from a Kinetics Consideration
- 3.04: Variation of Surface Coverage with Temperature and Pressure
- 3.05: Applications - Kinetics of Catalytic Reactions
- 04: UHV and Effects of Gas Pressure
- 4.01: What is UltraHigh Vacuum?
- 4.02: Why is UHV required for surface studies ?
- 4.E: UHV and Effects of Gas Pressure (Exercises)
- 05: Surface Analytical Techniques
- 5.01: Surface Sensitivity and Surface Specificity
- 5.02: Auger Electron Spectroscopy
- 5.03: Photoelectron Spectroscopy
- 5.04: Vibrational Spectroscopy
- 5.05: Secondary Ion Mass Spectrometry
- 5.06: Temperature-Programmed Techniques
- 06: Overlayer Structures and Surface Diffraction
- 6.01: Classification of Overlayer Structures
- 6.02: Low Energy Electron Diffraction (LEED)
- 6.03: Reflection High Energy Electron Diffraction (RHEED)
- 6.04: Examples - Surface Structures
- 07: Surface Imaging and Depth Profiling
- 7.01: Basic concepts in surface imaging and localized spectroscopy
- 7.02: Electron Microscopy - SEM and SAM
- 7.03: Imaging XPS
- 7.04: SIMS - Imaging and Depth Profiling
- 7.05: Auger Depth Profiling
- 7.06: Scanning Probe Microscopy - STM and AFM